Publications

Peer-Reviewed Publications

† indicates equal contribution

• ICCAD’25 CROP: Circuit Retrieval and Optimization with Parameter Guidance using LLMs
  Jingyu Pan^†, Isaac Jacobson^†, Zheng Zhao, Tung-Chieh Chen, Guanglei Zhou, Chen-Chia Chang, Vineet Rashingkar, and Yiran Chen
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2025. (Acceptance rate=24.7%) arXiv

• ASP-DAC’25 PRICING: Privacy-Preserving Circuit Data Sharing Framework for Lithographic Hotspot Detection
  Chen-Chia Chang, Wan-Hsuan Lin, Jingyu Pan, Guanglei Zhou, Zhiyao Xie, Jiang Hu, and Yiran Chen
  Asia and South Pacific Design Automation Conference (ASP-DAC), 2025. (Acceptance rate=28.6%) ACM

• TODAES’25 A Survey of Research in Large Language Models for Electronic Design Automation
  Jingyu Pan, Guanglei Zhou, Chen-Chia Chang, Isaac Jacobson, Jiang Hu, and Yiran Chen
  ACM Transactions on Design Automation of Electronic Systems (TODAES), 2025. ACM

• ICCAD’24 EDALearn: A Comprehensive RTL-to-Signoff EDA Benchmark for Democratized and Reproducible ML for EDA Research (Invited Paper)
  Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Yiran Chen, and Hai Li
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2024. ACM

• TCAD’23 Lithography Hotspot Detection Based on Heterogeneous Federated Learning with Local Adaptation and Feature Selection
  Jingyu Pan^†, Xuezhong Lin^†, Jinming Xu, Yiran Chen, and Cheng Zhuo
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2023. IEEE PDF

• TCAD’23 Toward Fully Automated Machine Learning for Routability Estimator Development
  Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Tunhou Zhang, Jiang Hu, and Yiran Chen
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2023. NSF

• ICCAD’23 PANDA: Architecture-Level Power Evaluation by Unifying Analytical and Machine Learning Solutions
  Qijun Zhang, Shiyu Li, Guanglei Zhou, Jingyu Pan, Chen-Chia Chang, and Yiran Chen
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2023. (Acceptance rate=23%) IEEE

• ASP-DAC’23 Rethink before Releasing your Model: ML Model Extraction Attack in EDA 🏆 Best Paper Award
  Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Jiang Hu, and Yiran Chen
  Asia and South Pacific Design Automation Conference (ASP-DAC), 2023. (Acceptance rate=31.0%) ACM PDF

• ASP-DAC’23 Fully Automated Machine Learning Model Development for Analog Placement Quality Prediction
  Chen-Chia Chang, Jingyu Pan, Zhiyao Xie, Yaguang Li, Yishuang Lin, Jiang Hu, and Yiran Chen
  Asia and South Pacific Design Automation Conference (ASP-DAC), 2023. (Acceptance rate=31.0%) ACM PDF

• ICCAD’22 Robustify ML-based Lithography Hotspot Detectors
  Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Jiang Hu, and Yiran Chen
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2022. (Acceptance rate=22.5%) ACM PDF

• ICCAD’22 DEEP: Developing Extremely Efficient Runtime On-Chip Power Meters
  Zhiyao Xie, Shiyu Li, Mingyuan Ma, Chen-Chia Chang, Jingyu Pan, Yiran Chen, and Jiang Hu
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2022. (Acceptance rate=22.5%) ACM

• ASP-DAC’22 Lithography Hotspot Detection via Heterogeneous Federated Learning with Local Adaptation
  Xuezhong Lin^†, Jingyu Pan^†, Yiran Chen, Jinming Xu, and Cheng Zhuo
  Asia and South Pacific Design Automation Conference (ASP-DAC), 2022. arXiv

• DAC’22 Towards Collaborative Intelligence: Routability Estimation based on Decentralized Private Data
  Jingyu Pan, Chen-Chia Chang, Zhiyao Xie, Ang Li, Minxue Tang, Tunhou Zhang, Jiang Hu, and Yiran Chen
  ACM/IEEE Design Automation Conference (DAC), 2022. (Acceptance rate=23%) ACM arXiv

• TCAD’22 The Dark Side: Security and Reliability Concerns in Machine Learning for EDA
  Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Jiang Hu, and Yiran Chen
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022. PDF

• TCAD’22 Pre-Placement Net Length and Timing Estimation by Customized Graph Neural Network
  Zhiyao Xie, Rongjian Liang, Xiaoqing Xu, Jiang Hu, Chen-Chia Chang, Jingyu Pan, and Yiran Chen
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2022. NSF

• ICCAD’21 Automatic Routability Predictor Development Using Neural Architecture Search
  Chen-Chia Chang^†, Jingyu Pan^†, Tunhou Zhang, Zhiyao Xie, Jiang Hu, Weiyi Qi, Chung-Wei Lin, Rongjian Liang, Joydeep Mitra, Elias Fallon, and Yiran Chen
  IEEE/ACM International Conference on Computer Aided Design (ICCAD), 2021. (Acceptance rate=23.5%) ACM arXiv

• DATE’19 One Fault is All it Needs: Breaking Higher-Order Masking with Persistent Fault Analysis
  Jingyu Pan, Fan Zhang, Kui Ren, and Shivam Bhasin
  Design, Automation & Test in Europe Conference & Exhibition (DATE), 2019. (Acceptance rate=24%) IACR

Book Chapters

• Book’22 Chapter 2: Deep Learning for Routability Prediction
  Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Rongjian Liang, Erick Carvajal Barboza, and Yiran Chen
  Machine Learning Applications in Electronic Design Automation, Springer, 2022. Springer PDF